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dc.date.accessioned2022-03-31T15:14:48Z
dc.date.available2022-12-27T23:46:35Z
dc.date.created2022-01-04T09:56:34Z
dc.date.issued2021
dc.identifier.citationAssmann, Nicole Persson, Clas Kuznetsov, Andrej Monakhov, Eduard . Fine structure in electronic transitions attributed to nitrogen donor in silicon carbide. Applied Physics Letters. 2021, 119(26)
dc.identifier.urihttp://hdl.handle.net/10852/93117
dc.description.abstractNitrogen in group-IV semiconductors has become a well-established element of qubits capable of room-temperature operation. In silicon carbide, nitrogen can occupy different nonequivalent lattice sites, giving rise to different shallow donor states. We report a triplet fine structure in electronic transitions of nitrogen donors on the quasi-cubic carbon site in 4H silicon carbide with activation enthalpies of around 100 meV. The intensities of triplet components have a prominent dependence on the voltage bias. The activation enthalpies of the transitions exhibit the Poole–Frenkel effect, while no bias dependence is observed for the magnitude of splitting. A tentative explanation of the fine structure involves local symmetry changes due to stacking faults.
dc.languageEN
dc.titleFine structure in electronic transitions attributed to nitrogen donor in silicon carbide
dc.typeJournal article
dc.creator.authorAssmann, Nicole
dc.creator.authorPersson, Clas
dc.creator.authorKuznetsov, Andrej
dc.creator.authorMonakhov, Eduard
cristin.unitcode185,15,4,90
cristin.unitnameHalvlederfysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2
dc.identifier.cristin1974094
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied Physics Letters&rft.volume=119&rft.spage=&rft.date=2021
dc.identifier.jtitleApplied Physics Letters
dc.identifier.volume119
dc.identifier.issue26
dc.identifier.doihttps://doi.org/10.1063/5.0074046
dc.identifier.urnURN:NBN:no-95708
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn0003-6951
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/93117/1/5.0074046.pdf
dc.type.versionPublishedVersion
cristin.articleid262101
dc.relation.projectNFR/245963


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