dc.date.accessioned | 2021-11-10T16:16:58Z | |
dc.date.available | 2021-11-10T16:16:58Z | |
dc.date.created | 2021-11-02T14:34:31Z | |
dc.date.issued | 2021 | |
dc.identifier.citation | Janssen, Mathijs Adriaan . Locating the Frequency of Turnover in Thin-Film Diffusion Impedance. Journal of Physical Chemistry C. 2021, 125(28), 15737-15741 | |
dc.identifier.uri | http://hdl.handle.net/10852/89186 | |
dc.description.abstract | The impedance of diffusion is an important tool to investigate a wide variety of systems, including electrochemical devices such as Li-ion batteries, porous electrodes, and solar cells. The classical impedance model for diffusion in a thin layer with a blocking boundary contains two separate regimes: Warburg diffusion at high frequency and capacitive charging at low frequency. Here, we provide a physical criterion for the transition between these two regimes, as the point of closest approach between early- and late-time approximations of the exact diffusion current. The resulting frequency is (π2/2)ωd with respect to the natural frequency ωd = Dn/L2, with Dn being the diffusion constant and L being the thickness of the layer. | |
dc.language | EN | |
dc.rights | Attribution 4.0 International | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.title | Locating the Frequency of Turnover in Thin-Film Diffusion Impedance | |
dc.type | Journal article | |
dc.creator.author | Janssen, Mathijs Adriaan | |
cristin.unitcode | 185,15,13,15 | |
cristin.unitname | Mekanikk | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |
dc.identifier.cristin | 1950646 | |
dc.identifier.bibliographiccitation | info:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Physical Chemistry C&rft.volume=125&rft.spage=15737&rft.date=2021 | |
dc.identifier.jtitle | Journal of Physical Chemistry C | |
dc.identifier.volume | 125 | |
dc.identifier.issue | 28 | |
dc.identifier.startpage | 15737 | |
dc.identifier.endpage | 15741 | |
dc.identifier.doi | https://doi.org/10.1021/acs.jpcc.1c04572 | |
dc.identifier.urn | URN:NBN:no-91799 | |
dc.type.document | Tidsskriftartikkel | |
dc.type.peerreviewed | Peer reviewed | |
dc.source.issn | 1932-7447 | |
dc.identifier.fulltext | Fulltext https://www.duo.uio.no/bitstream/handle/10852/89186/2/acs.jpcc.1c04572.pdf | |
dc.type.version | PublishedVersion | |