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dc.date.accessioned2021-04-15T19:52:12Z
dc.date.available2021-08-06T22:45:48Z
dc.date.created2021-01-15T13:14:39Z
dc.date.issued2020
dc.identifier.citationKvalvik, Julie Nitsche Kvamme, Kristian Breivik Almaas, Kjetil Ruud, Amund Sønsteby, Henrik Hovde Nilsen, Ola . LiF by atomic layer deposition—Made easy. Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films. 2020, 38(5), 1-4
dc.identifier.urihttp://hdl.handle.net/10852/85284
dc.description.abstractLithium fluoride (LiF) is an integral part of UV optics. Recently, it has also gained attention for its role in the solid-electrolyte interphase on the anode of lithium-ion batteries. Atomic layer deposition (ALD) is the preferred tool for synthesizing conformal and pin-hole free LiF thin films, especially on high aspect ratio structures. Present routes to deposit LiF by ALD are based on HF or HF-pyridine as the fluorine source, requiring strict safety precautions. Other routes involve TiF4 or WF6, resulting in inclusions of Ti or W impurities in the resulting films. Herein, we present a new route to deposit LiF by ALD, using lithium tert-butoxide (LiOtBu) and NH4F as precursors. The process yields uniform films over a broad temperature range (150–300 °C), with a growth per cycle of 50.9 pm/cycle (225 °C). The films are free from any nitrogen contamination from the NH4F precursor. This process provides a facile route for high purity LiF thin films with the use of less harmful precursor chemistry.
dc.languageEN
dc.titleLiF by atomic layer deposition—Made easy
dc.typeJournal article
dc.creator.authorKvalvik, Julie Nitsche
dc.creator.authorKvamme, Kristian Breivik
dc.creator.authorAlmaas, Kjetil
dc.creator.authorRuud, Amund
dc.creator.authorSønsteby, Henrik Hovde
dc.creator.authorNilsen, Ola
cristin.unitcode185,15,12,0
cristin.unitnameKjemisk institutt
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1872127
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films&rft.volume=38&rft.spage=1&rft.date=2020
dc.identifier.jtitleJournal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films
dc.identifier.volume38
dc.identifier.issue5
dc.identifier.doihttps://doi.org/10.1116/6.0000314
dc.identifier.urnURN:NBN:no-87898
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn0734-2101
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/85284/2/6.0000314.pdf
dc.type.versionPublishedVersion
cristin.articleid050401
dc.relation.projectNFR/272253
dc.relation.projectNFR/244087
dc.relation.projectNFR/262387
dc.relation.projectNFR/143732


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