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dc.date.accessioned2021-04-09T19:49:25Z
dc.date.available2021-04-09T19:49:25Z
dc.date.created2020-04-22T09:36:17Z
dc.date.issued2020
dc.identifier.citationAzarov, Alexander Galeckas, Augustinas Mieszczyński, Cyprian Hallen, Anders Kuznetsov, Andrej . Effects of annealing on photoluminescence and defect interplay in ZnO bombarded by heavy ions: Crucial role of the ion dose. Journal of Applied Physics. 2020, 127
dc.identifier.urihttp://hdl.handle.net/10852/85129
dc.description.abstractBombardment of ZnO with heavy ions generating dense collision cascades is of particular interest because of the formation of nontrivial damage distribution involving a defected layer located between the surface and the bulk damage regions, as seen by Rutherford backscattering spectroscopy in the channeling mode. By correlating photoluminescence and channeling data, we demonstrate that the thermal evolution of defects in wurtzite ZnO single crystals implanted with Cd ions strongly depends on the implanted dose. Specifically, the ion dose has a profound effect on the optical response in the spectral range between the near-band-edge emission and deep-level emission bands. The interplay between interstitial and vacancy type defects during annealing is discussed in relation to the evolution of the multipeak damage distribution.
dc.languageEN
dc.titleEffects of annealing on photoluminescence and defect interplay in ZnO bombarded by heavy ions: Crucial role of the ion dose
dc.typeJournal article
dc.creator.authorAzarov, Alexander
dc.creator.authorGaleckas, Augustinas
dc.creator.authorMieszczyński, Cyprian
dc.creator.authorHallen, Anders
dc.creator.authorKuznetsov, Andrej
cristin.unitcode185,15,17,0
cristin.unitnameSenter for materialvitenskap og nanoteknologi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1
dc.identifier.cristin1807464
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Applied Physics&rft.volume=127&rft.spage=&rft.date=2020
dc.identifier.jtitleJournal of Applied Physics
dc.identifier.volume127
dc.identifier.issue2
dc.identifier.pagecount7
dc.identifier.doihttps://doi.org/10.1063/1.5134011
dc.identifier.urnURN:NBN:no-87982
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn0021-8979
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/85129/1/JAP19-AR-DIS2020-06554.pdf
dc.type.versionAcceptedVersion
cristin.articleid025701
dc.relation.projectNFR/257639
dc.relation.projectNFR/251131


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