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Characterization of electrical properties in ZnO and SiC; A study of semiconductor band structure by automating procedures in a Transmission Electron Microscope

dc.contributor.authorKiste, Mikael Bergedalen
dc.date.accessioned2020-12-09T23:45:55Z
dc.date.available2020-12-09T23:45:55Z
dc.date.issued2020
dc.identifier.citationKiste, Mikael Bergedalen. Characterization of electrical properties in ZnO and SiC; A study of semiconductor band structure by automating procedures in a Transmission Electron Microscope. Master thesis, University of Oslo, 2020
dc.identifier.urihttp://hdl.handle.net/10852/81540
dc.description.abstractnob
dc.language.isonob
dc.subjectZnO
dc.subjectSiC
dc.subjectq-EELS
dc.subjectTEM
dc.titleCharacterization of electrical properties in ZnO and SiC; A study of semiconductor band structure by automating procedures in a Transmission Electron Microscopenob
dc.title.alternativeKarakterisering av elektriske egenskaper til ZnO og SiCeng
dc.typeMaster thesis
dc.date.updated2020-12-09T23:45:55Z
dc.creator.authorKiste, Mikael Bergedalen
dc.identifier.urnURN:NBN:no-84619
dc.type.documentMasteroppgave
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/81540/1/mikael_thesis_final.pdf


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