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dc.date.accessioned2020-07-09T19:47:10Z
dc.date.available2020-07-09T19:47:10Z
dc.date.created2019-06-18T14:23:24Z
dc.date.issued2019
dc.identifier.citationBickford, Justin R Sønsteby, Henrik Hovde Strnad, Nicholas A Zavalij, Peter Y Hoffman, Robert C . Control of potassium tantalate niobate thin film crystal phase and orientation by atomic layer deposition. Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films. 2019, 37(2), 020904-1-020904-6
dc.identifier.urihttp://hdl.handle.net/10852/77732
dc.description.abstractDue to its appreciable electro-optical properties, potassium tantalate niobate (KTN) thin films of high quality are expected to enhance the functionality of integrated photonics optical modulators. Unfortunately, they are inherently hard to synthesize. Herein, the authors present atomic layer deposition (ALD) of oriented KTN for the first time. They study the variability in phase content with respect to potassium concentration across a variety of substrates. Films grown with a slight overstoichiometry in potassium show excellent crystal quality of a pure perovskite phase. Highly oriented films were obtained on substrates of a similar lattice constant to bulk potassium tantalate niobate. Nearly stoichiometric potassium contents yield films with similar quality, albeit with trace amounts of pyrochlore. Potassium deficient films consist of an overwhelming amount of pyrochlore. Phase control and orientation control are essential when considering device integration of optical modulators. The authors believe that ALD is an ideal technique to obtain KTN thin films with high growth control.
dc.languageEN
dc.titleControl of potassium tantalate niobate thin film crystal phase and orientation by atomic layer deposition
dc.typeJournal article
dc.creator.authorBickford, Justin R
dc.creator.authorSønsteby, Henrik Hovde
dc.creator.authorStrnad, Nicholas A
dc.creator.authorZavalij, Peter Y
dc.creator.authorHoffman, Robert C
cristin.unitcode185,15,12,60
cristin.unitnameUorganisk materialkjemi
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1705780
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films&rft.volume=37&rft.spage=020904-1&rft.date=2019
dc.identifier.jtitleJournal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films
dc.identifier.volume37
dc.identifier.issue2
dc.identifier.doihttps://doi.org/10.1116/1.5063925
dc.identifier.urnURN:NBN:no-80809
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn0734-2101
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/77732/1/1.5063925.pdf
dc.type.versionPublishedVersion
cristin.articleid020904


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