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dc.date.accessioned2020-04-24T19:58:39Z
dc.date.available2020-04-24T19:58:39Z
dc.date.created2019-09-28T19:22:59Z
dc.date.issued2019
dc.identifier.citationAaboud, Morad Aad, Georges Abbott, Brad Abbott, Dale C. Abdinov, Ovsat Bahram oglu Abhayasinghe, Deshan Kavishka Abidi, Syed Haider AbouZeid, Hass Abraham, Nadine L. Abramowicz, Halina Buanes, Trygve Djuvsland, Julia Isabell Eigen, Gerald Fomin, Nikolai Lipniacka, Anna Martin dit Latour, Bertrand Mæland, Steffen Stugu, Bjarne Yang, Zongchang Bugge, Magnar Kopangen Cameron, David Gordon Catmore, James Richard Feigl, Simon Garonne, Vincent Gramstad, Eirik Hellesund, Simen Morisbak, Vanja Oppen, Henrik Ould-Saada, Farid Pedersen, Maiken Read, Alexander Lincoln Røhne, Ole Myren Sandaker, Heidi Vadla, Knut Oddvar Høie Abreu, Henso Abulaiti, Yiming Acharya, Bobby S. Adachi, Shunsuke Adam, Lennart Adam-Bourdarios, Claire Adamczyk, Leszek Adamek, Lukas Adelman, Jareed Adersberger, Michael Adigüzel, Aytül Adye, Tim Affolder, Anthony Allen Afik, Yoav Agapopoulou, Christina Agaras, Merve Nazlim ATLAS, Collaboration . Modelling radiation damage to pixel sensors in the ATLAS detector. Journal of Instrumentation. 2019, 14:P06012(6), 1-51
dc.identifier.urihttp://hdl.handle.net/10852/74842
dc.description.abstractSilicon pixel detectors are at the core of the current and planned upgrade of the ATLAS experiment at the LHC. Given their close proximity to the interaction point, these detectors will be exposed to an unprecedented amount of radiation over their lifetime. The current pixel detector will receive damage from non-ionizing radiation in excess of 1015 1 MeV neq/cm2, while the pixel detector designed for the high-luminosity LHC must cope with an order of magnitude larger fluence. This paper presents a digitization model incorporating effects of radiation damage to the pixel sensors. The model is described in detail and predictions for the charge collection efficiency and Lorentz angle are compared with collision data collected between 2015 and 2017 (≤ 1015 1 MeV neq/cm2).en_US
dc.languageEN
dc.rightsAttribution 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/
dc.titleModelling radiation damage to pixel sensors in the ATLAS detectoren_US
dc.typeJournal articleen_US
dc.creator.authorAaboud, Morad
dc.creator.authorAad, Georges
dc.creator.authorAbbott, Brad
dc.creator.authorAbbott, Dale C.
dc.creator.authorAbdinov, Ovsat Bahram oglu
dc.creator.authorAbhayasinghe, Deshan Kavishka
dc.creator.authorAbidi, Syed Haider
dc.creator.authorAbouZeid, Hass
dc.creator.authorAbraham, Nadine L.
dc.creator.authorAbramowicz, Halina
dc.creator.authorBuanes, Trygve
dc.creator.authorDjuvsland, Julia Isabell
dc.creator.authorEigen, Gerald
dc.creator.authorFomin, Nikolai
dc.creator.authorLipniacka, Anna
dc.creator.authorMartin dit Latour, Bertrand
dc.creator.authorMæland, Steffen
dc.creator.authorStugu, Bjarne
dc.creator.authorYang, Zongchang
dc.creator.authorBugge, Magnar Kopangen
dc.creator.authorCameron, David Gordon
dc.creator.authorCatmore, James Richard
dc.creator.authorFeigl, Simon
dc.creator.authorGaronne, Vincent
dc.creator.authorGramstad, Eirik
dc.creator.authorHellesund, Simen
dc.creator.authorMorisbak, Vanja
dc.creator.authorOppen, Henrik
dc.creator.authorOuld-Saada, Farid
dc.creator.authorPedersen, Maiken
dc.creator.authorRead, Alexander Lincoln
dc.creator.authorRøhne, Ole Myren
dc.creator.authorSandaker, Heidi
dc.creator.authorVadla, Knut Oddvar Høie
dc.creator.authorAbreu, Henso
dc.creator.authorAbulaiti, Yiming
dc.creator.authorAcharya, Bobby S.
dc.creator.authorAdachi, Shunsuke
dc.creator.authorAdam, Lennart
dc.creator.authorAdam-Bourdarios, Claire
dc.creator.authorAdamczyk, Leszek
dc.creator.authorAdamek, Lukas
dc.creator.authorAdelman, Jareed
dc.creator.authorAdersberger, Michael
dc.creator.authorAdigüzel, Aytül
dc.creator.authorAdye, Tim
dc.creator.authorAffolder, Anthony Allen
dc.creator.authorAfik, Yoav
dc.creator.authorAgapopoulou, Christina
dc.creator.authorAgaras, Merve Nazlim
dc.creator.authorATLAS, Collaboration
cristin.unitcode185,15,4,0
cristin.unitnameFysisk institutt
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1730654
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Instrumentation&rft.volume=14:P06012&rft.spage=1&rft.date=2019
dc.identifier.jtitleJournal of Instrumentation
dc.identifier.volume14
dc.identifier.issue06
dc.identifier.startpageP06012
dc.identifier.endpageP06012
dc.identifier.doihttps://doi.org/10.1088/1748-0221/14/06/P06012
dc.identifier.urnURN:NBN:no-77942
dc.subject.nviVDP::Kjerne- og elementærpartikkelfysikk: 431
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn1748-0221
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/74842/1/Aaboud_2019_J._Inst._14_P06012.pdf
dc.type.versionPublishedVersion
dc.relation.projectNFR/255182


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