Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations

dc.date.accessioned	2020-04-21T19:17:32Z
dc.date.available	2020-04-21T19:17:32Z
dc.date.created	2019-11-19T19:26:48Z
dc.date.issued	2020
dc.identifier.citation	Aarholt, Thomas Frodason, Ymir Kalmann Prytz, Øystein . Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations. Ultramicroscopy. 2020, 209
dc.identifier.uri	http://hdl.handle.net/10852/74719
dc.language	EN
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.uri	https://creativecommons.org/licenses/by-nc-nd/4.0/
dc.title	Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations
dc.type	Journal article
dc.creator.author	Aarholt, Thomas
dc.creator.author	Frodason, Ymir Kalmann
dc.creator.author	Prytz, Øystein
cristin.unitcode	185,15,17,20
cristin.unitname	Senter for Materialvitenskap og Nanoteknologi fysikk
cristin.ispublished	true
cristin.fulltext	original
cristin.qualitycode	1
dc.identifier.cristin	1749627
dc.identifier.bibliographiccitation	info:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Ultramicroscopy&rft.volume=209&rft.spage=&rft.date=2020
dc.identifier.jtitle	Ultramicroscopy
dc.identifier.volume	209
dc.identifier.doi	https://doi.org/10.1016/j.ultramic.2019.112884
dc.identifier.urn	URN:NBN:no-77794
dc.type.document	Tidsskriftartikkel
dc.type.peerreviewed	Peer reviewed
dc.source.issn	0304-3991
dc.identifier.fulltext	Fulltext https://www.duo.uio.no/bitstream/handle/10852/74719/2/aarholt_ultramic_2019.pdf
dc.type.version	PublishedVersion
cristin.articleid	112884
dc.relation.project	NFR/251131
dc.relation.project	NFR/245963
dc.relation.project	NFR/197405