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dc.date.accessioned2020-04-20T18:12:14Z
dc.date.available2020-04-20T18:12:14Z
dc.date.created2019-09-17T20:22:13Z
dc.date.issued2019
dc.identifier.citationKjeldstad, Torunn Thøgersen, Annett Stange, Marit Synnøve Sæverud Jensen, Ingvild Julie Thue Monakhov, Eduard Galeckas, Augustinas . Surface effects and optical properties of self-assembled nanostructured a-Si:Al. Nanomaterials. 2019, 9(8), 1-12
dc.identifier.urihttp://hdl.handle.net/10852/74644
dc.description.abstractWe present a study of the surface effects and optical properties of the self-assembled nanostructures comprised of vertically aligned 5 nm-diameter Al nanowires embedded in an amorphous Si matrix (a-Si:Al). The controlled (partial) removal of Al nanowires in a selective etching process yielded nanoporous a-Si media with a variable effective surface area. Different spectroscopy techniques, such as X-ray photoelectron spectroscopy (XPS), UV-Vis spectrophotometry and photoluminescence (PL), have been combined to investigate the impact of such nanostructuring on optical absorption and emission properties. We also examine long-term exposure to air ambient and show that increasing level of surface oxidation determines the oxide defect-related nature of the dominant PL emission from the nanoporous structures. The role of bulk, nanosize and surface effects in optical properties has been separated and quantified, providing a better understanding of the potential of such nanoporous a-Si:Al structures for future device developments
dc.languageEN
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.titleSurface effects and optical properties of self-assembled nanostructured a-Si:Al
dc.typeJournal article
dc.creator.authorKjeldstad, Torunn
dc.creator.authorThøgersen, Annett
dc.creator.authorStange, Marit Synnøve Sæverud
dc.creator.authorJensen, Ingvild Julie Thue
dc.creator.authorMonakhov, Eduard
dc.creator.authorGaleckas, Augustinas
cristin.unitcode185,15,4,0
cristin.unitnameFysisk institutt
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1725922
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Nanomaterials&rft.volume=9&rft.spage=1&rft.date=2019
dc.identifier.jtitleNanomaterials
dc.identifier.volume9
dc.identifier.issue8
dc.identifier.doihttps://doi.org/10.3390/nano9081106
dc.identifier.urnURN:NBN:no-77757
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn2079-4991
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/74644/1/nanomaterials-09-01106-v2.pdf
dc.type.versionPublishedVersion
cristin.articleid1106
dc.relation.projectNFR/231658
dc.relation.projectNFR/245963


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