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dc.date.accessioned2019-01-07T13:32:51Z
dc.date.available2019-05-08T22:46:52Z
dc.date.created2018-06-03T09:02:59Z
dc.date.issued2018
dc.identifier.citationMajdi, Tahereh Pal, Souvik Hafreager, Anders Murad, Sohail Sahu, Rakesh Prasad Puri, Ishwar K . Altering thermal transport by strained-layer epitaxy. Applied Physics Letters. 2018, 112(19)
dc.identifier.urihttp://hdl.handle.net/10852/66047
dc.description.abstractSince strain changes the interatomic spacing of matter and alters electron and phonon dispersion, an applied strain can modify the thermal conductivity k of a material. We show how the strain induced by heteroepitaxy is a passive mechanism to change k in a thin film. Molecular dynamics simulations of the deposition and epitaxial growth of ZnTe thin films provide insights into the role of interfacial strain in the conductivity of a deposited film. ZnTe films grow strain-free on latticematched ZnTe substrates, but similar thin films grown on a lattice-mismatched CdTe substrate exhibit 6% biaxial in-plane tensile strain and 7% uniaxial out-of-plane compressive strain. In the T ¼ 700 K–1100 K temperature range, the conductivities of strained ZnTe layers decrease to 60% of their unstrained values. The resulting understanding of dk/dT shows that strain engineering can be used to alter the performance of a thermal rectifier and also provides a framework for enhancing thermoelectric devices.en_US
dc.languageEN
dc.publisherAmerican Institute of Physics
dc.titleAltering thermal transport by strained-layer epitaxyen_US
dc.title.alternativeENEngelskEnglishAltering thermal transport by strained-layer epitaxy
dc.typeJournal articleen_US
dc.creator.authorMajdi, Tahereh
dc.creator.authorPal, Souvik
dc.creator.authorHafreager, Anders
dc.creator.authorMurad, Sohail
dc.creator.authorSahu, Rakesh Prasad
dc.creator.authorPuri, Ishwar K
cristin.unitcode185,15,4,10
cristin.unitnameKondenserte fasers fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2
dc.identifier.cristin1588517
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied Physics Letters&rft.volume=112&rft.spage=&rft.date=2018
dc.identifier.jtitleApplied Physics Letters
dc.identifier.volume112
dc.identifier.issue19
dc.identifier.doihttp://dx.doi.org/10.1063/1.5022097
dc.identifier.urnURN:NBN:no-68555
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn0003-6951
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/66047/2/1588517.pdf
dc.type.versionPublishedVersion


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