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dc.date.accessioned2017-08-16T15:05:17Z
dc.date.available2017-08-16T15:05:17Z
dc.date.created2010-08-25T18:05:28Z
dc.date.issued2010
dc.identifier.citationVenkatachalapathy, Vishnukanthan Galeckas, Augustinas Zubiaga, Asier Tuomisto, Filip Kuznetsov, Andrej . Changing vacancy balance in ZnO by tuning synthesis between zinc/oxygen lean conditions. Journal of Applied Physics. 2010, 108(4)
dc.identifier.urihttp://hdl.handle.net/10852/57134
dc.description.abstractThe nature of intrinsic defects in ZnO films grown by metal organic vapor phase epitaxy was studied by positron annihilation and photoluminescence spectroscopy techniques. The supply of Zn and O during the film synthesis was varied by applying different growth temperatures (325–485 °C), affecting decomposition of the metal organic precursors. The microscopic identification of vacancy complexes was derived from a systematic variation in the defect balance in accordance with Zn/O supply trends. This research was originally published in the Journal of Applied Physics. © AIP Publishingen_US
dc.languageEN
dc.publisherAmerican Institute of Physics (AIP)
dc.titleChanging vacancy balance in ZnO by tuning synthesis between zinc/oxygen lean conditionsen_US
dc.typeJournal articleen_US
dc.creator.authorVenkatachalapathy, Vishnukanthan
dc.creator.authorGaleckas, Augustinas
dc.creator.authorZubiaga, Asier
dc.creator.authorTuomisto, Filip
dc.creator.authorKuznetsov, Andrej
cristin.unitcode185,15,4,0
cristin.unitnameFysisk institutt
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2
dc.identifier.cristin508263
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Applied Physics&rft.volume=108&rft.spage=&rft.date=2010
dc.identifier.jtitleJournal of Applied Physics
dc.identifier.volume108
dc.identifier.issue4
dc.identifier.pagecount3
dc.identifier.doihttp://dx.doi.org/10.1063/1.3462394
dc.identifier.urnURN:NBN:no-59873
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn0021-8979
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/57134/2/1%25252E3462394.pdf
dc.type.versionPublishedVersion


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