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dc.date.accessioned2017-08-10T12:59:56Z
dc.date.available2017-08-10T12:59:56Z
dc.date.created2011-09-15T14:37:06Z
dc.date.issued2011
dc.identifier.citationAzarov, Alexander Zhang, Tianchong Svensson, Bengt Gunnar Kuznetsov, Andrej . Cd diffusion and thermal stability of CdZnO/ZnO heterostructures. Applied Physics Letters. 2011, 99(11)
dc.identifier.urihttp://hdl.handle.net/10852/56948
dc.description.abstractStructural properties and thermal stability of CdZnO/ZnO heterostructures grown on sapphire substrate by metal-organic vapor phase epitaxy (MOVPE) have been studied. Zn/Cd interdiffusion and Cd evaporation appear as key factors limiting the thermal stability of CdZnO/ZnO heterostructures. Cd diffusion in MOVPE ZnO is found to start already at 600 °C with an activation energy of ∼2.2 eV and yields a saturation in the Cd concentration at 0.1-1 at. %. The actual Cd content remaining in the samples upon annealing is determined by a competition between Cd evaporation via the surface and diffusion/segregation in the bulk. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.en_US
dc.languageEN
dc.publisherAmerican Institute of Physics
dc.titleCd diffusion and thermal stability of CdZnO/ZnO heterostructuresen_US
dc.typeJournal articleen_US
dc.creator.authorAzarov, Alexander
dc.creator.authorZhang, Tianchong
dc.creator.authorSvensson, Bengt Gunnar
dc.creator.authorKuznetsov, Andrej
cristin.unitcode185,15,17,0
cristin.unitnameSenter for materialvitenskap og nanoteknologi
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2
dc.identifier.cristin839775
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied Physics Letters&rft.volume=99&rft.spage=&rft.date=2011
dc.identifier.jtitleApplied Physics Letters
dc.identifier.volume99
dc.identifier.issue11
dc.identifier.doihttp://dx.doi.org/10.1063/1.3639129
dc.identifier.urnURN:NBN:no-59680
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn0003-6951
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/56948/2/1%25252E3639129.pdf
dc.type.versionPublishedVersion


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