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dc.date.accessioned2015-01-26T14:47:20Z
dc.date.available2015-01-26T14:47:20Z
dc.date.created2014-06-02T14:58:02Z
dc.date.issued2014
dc.identifier.citationBarndorff-Nielsen, Ole E. Benth, Fred Espen Szozda, Benedykt . On stochastic integration for volatility modulated Brownian driven Volterra processes via white noise analysis. Infinite Dimensional Analysis Quantum Probability and Related Topics. 2014, 17(2)
dc.identifier.urihttp://hdl.handle.net/10852/41914
dc.description.abstractThis paper generalizes the integration theory for volatility modulated Brownian-driven Volterra processes onto the space of Potthoff–Timpel distributions. Sufficient conditions for integrability of generalized processes are given, regularity results and properties of the integral are discussed. We introduce a new volatility modulation method through the Wick product and discuss its relation to the pointwise-multiplied volatility model. Preprint of an article published in Infinite Dimensional Analysis Quantum Probability and Related Topics. 2014, 17 (2), DOI: http://dx.doi.org/10.1142/S0219025714500118 © World Scientific Publishing Company http://www.worldscientific.com/worldscinet/idaqpen_US
dc.languageEN
dc.language.isoenen_US
dc.titleOn stochastic integration for volatility modulated Brownian driven Volterra processes via white noise analysisen_US
dc.typeJournal articleen_US
dc.creator.authorBarndorff-Nielsen, Ole E.
dc.creator.authorBenth, Fred Espen
dc.creator.authorSzozda, Benedykt
cristin.unitcode185,15,13,35
cristin.unitnameStokastisk analyse, finans, forsikring og risiko
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode2
dc.identifier.cristin1135929
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Infinite Dimensional Analysis Quantum Probability and Related Topics&rft.volume=17&rft.spage=&rft.date=2014
dc.identifier.jtitleInfinite Dimensional Analysis Quantum Probability and Related Topics
dc.identifier.volume17
dc.identifier.issue2
dc.identifier.doihttp://dx.doi.org/10.1142/S0219025714500118
dc.identifier.urnURN:NBN:no-46321
dc.type.documentTidsskriftartikkelen_US
dc.source.issn0219-0257
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/41914/2/paper19.pdf
dc.type.versionSubmittedVersion


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