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dc.date.accessioned2014-01-09T11:02:40Z
dc.date.available2014-01-09T11:02:40Z
dc.date.issued2013en_US
dc.date.submitted2013-06-03en_US
dc.identifier.citationBjørndal, Øystein. Millimeter wave interconnect and slow wave transmission lines in CMOS. Masteroppgave, University of Oslo, 2013en_US
dc.identifier.urihttp://hdl.handle.net/10852/37967
dc.description.abstractWhen heading into the millimeter wave frequency band, even wires on CMOS exhibit transmission line effects, this thesis therefore presents models, simulation and measurements for transmission lines on CMOS. The main goal is slow wave miniaturization, and models are explored for both a traditional CPW line above a silicon substrate and slow wave lines, emphasis is given on analytical over empirical formulations where loss is modeled by conductor skin effect, and conductive and dielectric polarization caused by the silicon substrate. Full 3D Electromagnetic simulation is used as a comparison, and to model more complex structures like a digitally tuned slow wave line. Models and simulations are compared to fabricated lines on a commercial CMOS process, where deembedding using the LL method is described in short. A new comb slow wave grounded coplanar waveguide (comb-S-GCPW) is presented, with an effective dielectric constant of 140 leading to a size reduction of 83 % compared to a traditional CPW. Applications of the published line is explored, with emphasis on filters.eng
dc.language.isoengen_US
dc.titleMillimeter wave interconnect and slow wave transmission lines in CMOSen_US
dc.typeMaster thesisen_US
dc.date.updated2014-01-03en_US
dc.creator.authorBjørndal, Øysteinen_US
dc.subject.nsiVDP::430en_US
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&rft.au=Bjørndal, Øystein&rft.title=Millimeter wave interconnect and slow wave transmission lines in CMOS&rft.inst=University of Oslo&rft.date=2013&rft.degree=Masteroppgaveen_US
dc.identifier.urnURN:NBN:no-40265
dc.type.documentMasteroppgaveen_US
dc.identifier.duo182085en_US
dc.contributor.supervisorSvein-Erik Hamran, Tor Sverre Lande and Kristian Gjertsen Kjelgården_US
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/37967/1/Bjorndal_Master.pdf


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