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  • Mahmood, Sohail Musa; Røed, Ketil; Velure, Arild; Winje, Fredrik Lindseth (Journal article / Tidsskriftartikkel / PublishedVersion; Peer reviewed, 2018)
    With the continuous scaling of the CMOS technology, the CMOS circuits are considered to be more tolerant to Single event Latchup (SEL) effects due to the reduction in the supply voltages. This paper reports the results ...