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dc.date.accessioned2023-03-13T17:53:33Z
dc.date.available2023-03-13T17:53:33Z
dc.date.created2022-12-22T14:05:37Z
dc.date.issued2022
dc.identifier.citationBarragan-Yani, Daniel Polfus, Jonathan M. Wirtz, Ludger . Native defects in monolayer GaS and GaSe: Electrical properties and thermodynamic stability. PHYSICAL REVIEW MATERIALS. 2022, 6(11)
dc.identifier.urihttp://hdl.handle.net/10852/101412
dc.description.abstractStructural, electronic, and thermodynamic properties of native defects in GaS and GaSe monolayers are investigated by means of accurate ab initio calculations. Based on their charge transition levels we assess the influence of the studied defects on the electrical properties of the monolayers. Specifically, we show that native defects do not behave as shallow dopants and their presence cannot account for the experimentally observed intrinsic doping. In addition, we predict that native defects are efficient compensation and recombination centers. Besides pointing out their detrimental nature, we also calculate the corresponding finite-temperature formation energies and provide a window of growth conditions able to reduce the concentration of all relevant native defects.
dc.languageEN
dc.publisherAmerican Physical Society
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.titleNative defects in monolayer GaS and GaSe: Electrical properties and thermodynamic stability
dc.title.alternativeENEngelskEnglishNative defects in monolayer GaS and GaSe: Electrical properties and thermodynamic stability
dc.typeJournal article
dc.creator.authorBarragan-Yani, Daniel
dc.creator.authorPolfus, Jonathan M.
dc.creator.authorWirtz, Ludger
cristin.unitcode185,15,12,0
cristin.unitnameKjemisk institutt
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin2097037
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=PHYSICAL REVIEW MATERIALS&rft.volume=6&rft.spage=&rft.date=2022
dc.identifier.jtitlePHYSICAL REVIEW MATERIALS
dc.identifier.volume6
dc.identifier.issue11
dc.identifier.pagecount0
dc.identifier.doihttps://doi.org/10.1103/PhysRevMaterials.6.114002
dc.type.documentTidsskriftartikkel
dc.type.peerreviewedPeer reviewed
dc.source.issn2475-9953
dc.type.versionPublishedVersion
cristin.articleid114002
dc.relation.projectNFR/262274


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